Niu Research Group

Origin

Computational Resources and Softwares

CSE HPCC

Abaqus

Optical Surface Profiler

Stylus Profiler

TGA

TGA & DSC

DLS Particle Size Analyzer

FTIR

Confocal Microscopy

Environment SEM

SEM & EDX

TEM

Field Emission SEM

Measurement and Characterization

AFM - BRUKER BioScope Catalyst

AFM - BRUKER Dimension ICON

AFM - BRUKER Dimension FastScan

Micro Indentation Tester

Nano Indentation Tester - TI950

DMA Tester

Mechanical Tester

Mechanical Tester

Nano Indentation Tester - TI750

Multiscale Mechanical Testing

Omnicure S1500 UV Lamp

High Speed Mixer & Magnetic Stirrer

Halogen Curing Light

Oven

Vacuum Oven

Precision Saw

Polishing Machine

Ultra Microtome

Ultrasound Cleaner

Freeze Drier

Spin Coater

Ultrasonicator

Materials Fabrication